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Power Electronics Modeling Engineer

The candidate has strong experience in semiconductor device characterization, MOSFET modeling, and advanced noise measurements. He is skilled in operating wafer probe st…

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Executive snapshot

Experience: Ca. 3 Jahre relevante Erfahrung in Halbleitercharakterisierung, Gerätemodellierung, Laborautomatisierung und Sensortechnologien
Seniority: Mid-Level Engineer
Work mode: Möglich
Availability: Kurzfristig verfügbar
Region: Deutschland / EU
Focus: Halbleitercharakterisierung, MOSFET-Analyse, Rauschmessungen, Sensortechnologien

At a glance

Profile ID

DP-35519

Role

Semiconductor Characterization, Device Modeling, Test and Measurement Engineering, Lab Automation, Data Analysis, Sensor Technology, PCB-Based Test Systems, Reliability Testing

Seniority

Mid-Level Engineer

Experience

Ca. 3 Jahre relevante Erfahrung in Halbleitercharakterisierung, Gerätemodellierung, Laborautomatisierung und Sensortechnologien

Work mode

Möglich

Availability

Kurzfristig verfügbar

Region

Deutschland / EU

Languages

Deutsch: Gut, Englisch: Fließend, Hindi: Fließend, Gujarati: Native

Engagement models

Festanstellung, Projektarbeit

Indicative rate

Nicht angegeben

Short profile

The candidate has strong experience in semiconductor device characterization, MOSFET modeling, and advanced noise measurements. He is skilled in operating wafer probe stations, SMUs, and high-precision measurement setups. He develops automated Python pipelines for data analysis, parameter extraction, and lab automation. His work is precise, analytically sound, and well documented. He brings solid knowledge in sensor technologies, PCB-based measurement systems, and power electronics.

Focus (domains)

HalbleitercharakterisierungMOSFET-AnalyseRauschmessungenSensortechnologienLeistungselektronikPCB-basierte MesssystemeDatenanalyseModellierung

Core skills

Elektrische CharakterisierungWafer-Level-MessungenRauschmessungenDatenanalyseLaborautomatisierungParameterextraktionSimulationDokumentationPräsentation

Tools & technologies

PythonIC-CAPEasyExpertPrimariusOriginLabMATLABLabVIEWAltium DesignerSPICE-ToolsDC-SMUsOszilloskopeWafer-Probestationen

Track record & project highlights

Performed large-scale flicker and RTS noise measurements on MOSFETs and validated a statistical noise variation model. Automated wafer-level characterization using Python and generated complete wafer maps. Characterized pH sensors and analyzed correlations between sensor layers and electrode materials. Developed automated measurement methods for semiconductor device testing. Simulated BSIM4-based device models and compared them with experimental results. Set up and configured advanced wafer probe stations for reliability qualification.

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